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Digital systems testing and testable design

Digital systems testing and testable design Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Mumbai : Jaico Publishing House, 2013. - xviii, 652 p. : ill. ; 25 cm. - Electrical engineering, communications, and signal processing . - Electrical engineering communications and signal processing series. .

Includes bibliographical references (p. 644-645) and index.

ISBN: 8172248911 (Pbk) 9788172248918 = EECS-reference book collection

LCCN: 89025259

Subjects--Topical Terms:
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.

LC Class. No.: TK7874 / .A23 1990

Dewey Class. No.: 621.3815 D569

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