| 000 | 00648nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20161014115956.0 | ||
| 008 | 130919s9999 xx 000 0 und d | ||
| 020 | _a9780470847138 | ||
| 040 |
_aIISER Bhopal _cHBA |
||
| 082 | 0 | 0 | _a620.44W349I |
| 100 | 1 |
_aWatts, John F. _91283 |
|
| 222 | _aEngineering Collection | ||
| 245 |
_aIntroduction to surface analysis by xps and aes _cJohn F. Watts and John Wolstenholme. |
||
| 260 |
_aNew York : _bJohn Wiley and Sons, _c2008. |
||
| 300 | _ax, 212 p. | ||
| 650 | 0 |
_aSurface analysis. _916857 |
|
| 650 | 0 |
_aEngineering. _916858 |
|
| 700 | 1 |
_aWolstenholme, John. _916859 |
|
| 942 |
_cREF _2ddc |
||
| 999 |
_c3177 _d3177 |
||