000 01503cam a22003977a 4500
001 14524748
003 OSt
005 20180215113527.0
008 050510s2005 enka b 001 0 eng d
010 _a 2006462720
015 _aGBA542696
_2bnb
016 7 _a013200843
_2Uk
020 _a052184875X
020 _a9780521142304
035 _a(OCoLC)ocm60419337
040 _aIISER Bhopal
_cIISER Bhopal
042 _aukblsr
050 0 0 _aQE440
_b.R43 2005
082 0 4 _a552.8 R251E2
_223
100 1 _aReed, S. J. B.
_922377
222 _aEES-Textbook collection
245 1 0 _aElectron microprobe analysis and scanning electron microscopy in geology
_cS.J.B. Reed.
250 _a2nd ed.
260 _aCambridge :
_bCambridge University Press,
_c2010.
300 _axiii, 189 p., [8] p. of plates :
_bill., (some col.) ;
_c26 cm.
500 _aPrevious ed.: 1996.
504 _aIncludes bibliographical references and index.
650 0 _aPetrofabric analysis.
_922378
650 0 _aElectron probe microanalysis.
_922379
650 0 _aScanning electron microscopy.
_922380
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0668/2006462720-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy0668/2006462720-t.html
906 _a7
_bcbc
_ccopycat
_d2
_encip
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c8342
_d8342