000 | 01254pam a2200325 a 4500 | ||
---|---|---|---|
001 | 1981045 | ||
003 | OSt | ||
005 | 20180704103337.0 | ||
008 | 891018s1990 nyua b 001 0 eng | ||
010 | _a 89025259 | ||
020 | _a8172248911 (Pbk) | ||
020 | _a9788172248918 | ||
040 |
_aDLC _cIISER Bhopal _dDLC |
||
050 | 0 | 0 |
_aTK7874 _b.A23 1990 |
082 | 0 | 0 |
_a621.3815 D569 _223 |
222 | _aEECS-reference book collection | ||
245 | 1 | 0 |
_aDigital systems testing and testable design _cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman. |
260 |
_aMumbai : _bJaico Publishing House, _c2013. |
||
300 |
_axviii, 652 p. : _bill. ; _c25 cm. |
||
490 | 1 | _aElectrical engineering, communications, and signal processing | |
504 | _aIncludes bibliographical references (p. 644-645) and index. | ||
650 | 0 |
_aDigital integrated circuits _xTesting. _923209 |
|
650 | 0 |
_aDigital integrated circuits _xDesign and construction. _923210 |
|
700 | 1 |
_aAbramovici, Miron. _923211 _eEditor |
|
700 | 1 |
_aBreuer, Melvin A. _eEditor _923214 |
|
700 | 1 |
_aFriedman, Arthur D. _923212 _eEditor |
|
830 | 0 |
_aElectrical engineering communications and signal processing series. _923213 |
|
906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
942 |
_2ddc _cBK |
||
999 |
_c8533 _d8533 |