000 01254pam a2200325 a 4500
001 1981045
003 OSt
005 20180704103337.0
008 891018s1990 nyua b 001 0 eng
010 _a 89025259
020 _a8172248911 (Pbk)
020 _a9788172248918
040 _aDLC
_cIISER Bhopal
_dDLC
050 0 0 _aTK7874
_b.A23 1990
082 0 0 _a621.3815 D569
_223
222 _aEECS-reference book collection
245 1 0 _aDigital systems testing and testable design
_cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
260 _aMumbai :
_bJaico Publishing House,
_c2013.
300 _axviii, 652 p. :
_bill. ;
_c25 cm.
490 1 _aElectrical engineering, communications, and signal processing
504 _aIncludes bibliographical references (p. 644-645) and index.
650 0 _aDigital integrated circuits
_xTesting.
_923209
650 0 _aDigital integrated circuits
_xDesign and construction.
_923210
700 1 _aAbramovici, Miron.
_923211
_eEditor
700 1 _aBreuer, Melvin A.
_eEditor
_923214
700 1 _aFriedman, Arthur D.
_923212
_eEditor
830 0 _aElectrical engineering communications and signal processing series.
_923213
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c8533
_d8533